目錄:科睿設(shè)備有限公司>>半導(dǎo)體輔助設(shè)備>> 量子效率
| 產(chǎn)地類別 | 國產(chǎn) | 應(yīng)用領(lǐng)域 | 綜合 |
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量子效率測試標(biāo)準(zhǔn)：符合CE標(biāo)準(zhǔn)。符合性：適用于根據(jù)ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1進(jìn)行測量。
量子效率試驗(yàn)?zāi)康模?/span>
Sciencetech PTS系統(tǒng)使用用戶友好的軟件進(jìn)行SR、EQE、IQE和IV測量。該系統(tǒng)包括一個主氙弧燈、帶有自動順序分類濾光片的單色儀、一個穩(wěn)態(tài)太陽能模擬器AAA的級偏置光源（僅適用于PTS-2）測量電子設(shè)備、計(jì)算機(jī)和測量太陽能電池特性所需的軟件。該系統(tǒng)為用戶提供了一個不透光的樣品室，用于所有測量。屏蔽和不透光的測試區(qū)域外殼具有方便的可拆卸蓋子，允許從頂部、正面和側(cè)面進(jìn)入。
應(yīng)用：光伏太
特點(diǎn)：光譜范圍250-2500nm，可調(diào)光源，源測量單元，鎖定放大器，不透光樣品室，用戶可選擇偏壓，交流和直流測量模式，手動控制快門，SciPV軟件可控制系統(tǒng)。
Measurement Capabilities | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 IQE (175-9205) | |
Current-Voltage (IV) Testing | Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor | - | Included | Included |
Spectral Response (SR)* | 250 - 2500 nm scanning range | Included | Included | Included |
External Quantum Efficiency (EQE) | Incident photon to converted electron ratio (IPCE) | Included | Included | Included |
AC and DC measurement mode | Modulated / Continuous measurement capability | Included | Included | Included |
Internal Quantum Efficiency (IQE) | The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell | ---- | ---- | Included 300 - 1100 nm |
Technical Specifications
Configuration Description | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 QE+IQE (175-9205) | |
Tunable Light Source | · 150 W Xenon short arc lamp, 1200 hour lifetime | • | • | • |
· 250 - 2500 nm tuning/scanning range (Xenon) | • | • | • | |
· 1/4 m Czerny-Turner monochromator with an adjustable bandpass of 0.4 to 48 nm with 600 l/mm grating , 0.2-24 nm with 1200 l/mm grating | • | • | • | |
· Motorized triple grating turret system (3 gratings included): · 1200 l/mm blazed at 250 nm · 1200 l/mm blazed at 500 nm · 600 l/mm blazed at 1000 nm | • | • | • | |
· Adjustable beam size ( 0.5mm - 19 mm diameter with standard optics) | • | • | • | |
· Includes hard coated order sorting filters | • | • | • | |
Bias Light Source | · 150 W Xenon short arc lamp, average lifetime 1200 hours | - | • | • |
· 25x25mm AAA, (ASTM E927-19) Solar Simulator | • | • | ||
· Includes mounted AM1.5G filter + additional filter slot | - | • | • | |
Reference Detector | · Broadband pyroelectric detector with quartz window, Element diameter: 5 mm | • | • | • |
· Calibrated range 250 - 2500 nm | • | • | • | |
Measurement System | · Source meter, maximum 30 W, 30 V, 1 A | • | • | • |
· Voltage accuracy 30 µV and current accuracy 10 pA | • | • | • | |
· Measurement time period for 100 IV points is 20s | • | • | • | |
· Voltage bias user settable ±10 V capability | • | • | • | |
· Lock-in Amplifier | • | • | • | |
· Chopper 4 - 200 Hz | • | • | • | |
· Standard auto time constant feature | • | • | • | |
· Temperature control (10-60 °C) (1) | Accessory Available | Accessory Available | Accessory Available | |
· Ac and DC measurement mode | • | • | • | |
IQE Measurement System | · 50 mm integrating sphere | - | - | • |
· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 300 - 1100nm range. | - | - | • | |
Sample Placement | · 50 × 50 mm simple sample spacer for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections. | • | • | • |
Software and Interface | · Modern software written in (Windows 10/11 Operating System) | • | • | • |
· Compatible with Windows 10/11, 32/64bit | • | • | • | |
· Data files and automation log exportable as ASCII | • | • | • | |
· Pre-configured and tested control computer included | • | • | • | |
· Built in microcontroller switches and monitors signals automatically | • | • | • | |
· 1 USB port | • | • | • | |
· 1 IEC 60320 C14 power entry inlet | • | • | • | |
Compliance | · Intended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1 | • | • | • |
Power system | · Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz | • | • | • |
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